TY - JOUR AU - Radiom, Milad AU - Weder, Christoph AU - Fromm, Katharina M. AU - Kilbinger, Andreas F. M. AU - Maroni, Plinio AU - Ayer, Mathieu A. AU - di Giannantonio, Michela AU - Kong, Phally AU - Kozhuharov, Svilen AU - Borkovec, Michal PY - 2017/04/26 Y2 - 2024/03/28 TI - Quantitative Nano-characterization of Polymers Using Atomic Force Microscopy JF - CHIMIA JA - Chimia VL - 71 IS - 4 SE - Scientific Articles DO - 10.2533/chimia.2017.195 UR - https://www.chimia.ch/chimia/article/view/2017_195 SP - 195 AB - The present article offers an overview on the use of atomic force microscopy (AFM) to characterize the nanomechanical properties of polymers. AFM imaging reveals the conformations of polymer molecules at solid– liquid interfaces. In particular, for polyelectrolytes, the effect of ionic strength on the conformations of molecules can be studied. Examination of force versus extension profiles obtained using AFM-based single molecule force spectroscopy gives information on the entropic and enthalpic elasticities in pN to nN force range. In addition, single molecule force spectroscopy can be used to trigger chemical reactions and transitions at the molecular level when force-sensitive chemical units are embedded in a polymer backbone. ER -